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Kelvin Probe Force Microscopy

Name: Kelvin Probe Force Microscopy
Brand: Springer
SKU: 41045685
Price: 228.29 EUR
Availability: InStock
Author: Sascha Sadewasser
ISBN: 9783319756875

From Single Charge Detection to Device Characterization

Sascha Sadewasser

Thilo Glatzel

Lingua

Inglese

Libro elettronico Adobe ePub DRM

Codice Libristo: 41045685

Casa editrice Springer, marzo 2018

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic... Descrizione completa

Codice Libristo: 41045685

559 b

228.29 €

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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "e;Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,"e; presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.