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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Name: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Brand: Cambridge University Press
SKU: 02032669
Price: 175.89 EUR
Availability: InStock
Author: Zhong Lin Wang
ISBN: 9780521482660

Zhong Lin Wang

Lingua

Inglese

Libro Rigido

Codice Libristo: 02032669

Casa editrice Cambridge University Press, maggio 1996

In this book the theories, techniques and applications of reflection electron microscopy (REM), refl... Descrizione completa

Codice Libristo: 02032669

430 b

175.89 €

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In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.